Devices pass tests - then fail. We catch what tests miss.
powered by ✅ LockScore™
Reveal hidden failure — before it costs you yield.
For reliability and yield teams in advanced memory.
They look similar.
They are not.
Can you find the failure?
This is what you see but we see something very different.
Failure in 4 of these devices.
See how it works!
Run an Early Instability Scan on Your Devices
Early Instability Scan - We’ll identify devices instability — even when early sweeps still look normal.
1. Upload I–V sweep data (10–20 devices)
2. We analyze structural instability patterns
3. You receive GO / HOLD / NO-GO classifications in 48–72 hours
Devices that look identical early don’t always behave the same later.
Submit sample data → We analyze → You get results in 2–3 days
Even a 1% improvement in yield can translate to $5M–$20M annually per production line
What does ✅ LockScore™ detect that conventional reliability tools miss?
Traditional reliability workflows detect problems only after degradation appears through stress testing, burn-in, or failure analysis.
✅ LockScore reveals hidden structural instability earlier — giving engineering teams visibility into reliability risk before failure surfaces.
✅ LockScore™ Built for reliability and yield engineering teams working on advanced semiconductor devices.
✅ LockScore™
The score that matters
Even small gains in yield or faster scrap decisions unlock millions of dollars annually in recovered value.
Reveal hidden device failure risk before costly burn-in and field issues
Even a 0.5–2% yield improvement or earlier scrap decision can translate huge difference in cost savings.
